Design of an electronic system for acquisition of the tunneling current signal of a Scanning Tunneling Microscope STM

8th International Congress of Engineering Physics

物理学;工业技术

Ávila, J.F.^1 ; Aya, H.^1 ; Gualteros, E.M.^1

Facultad de Ingeniería, Universidad Distrital Francisco José de Caldas, Bogota, Colombia^1

关键词: Electronic systems;    Other properties;    Tunneling current;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/792/1/012084/pdf
DOI  :  10.1088/1742-6596/792/1/012084

学科分类：工业工程学

来源: IOP

【 摘 要 】

An electronic system was designed to acquire tunneling current of a Scanning Tunneling Microscope. A tunneling current originates from the interaction between a conductive tip and a conductive or semiconductor sample. Lower currents than 100 nA were generated and from them, voltages were obtained in the order of 1 volt. Using this mechanism, it is possible to construct images of the atoms positions on the surface of the sample, also other properties of the materials can be studied.