Development of a commercial positron annihilation lifetime measurement system

14th International Workshop on Slow Positron Beam Techniques & Applications

Yamawaki, M.^1 ; Ito, K.^1 ; Hattori, K.^2 ; Uesugi, N.^2

National Institute of Advanced Industrial Science and Technology, Higashi, Ibaraki, Tsukuba

305-8565, Japan^1

TOYO SEIKO Co. Ltd., Yatomi, Aichi

490-1412, Japan^2

关键词: Average lifetime;    Commercial systems;    Compact system;    Positron annihilation lifetime measurement;    Positron annihilation lifetimes;    Reference material;    Reproducibilities;    User friendly interface;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/791/1/012038/pdf
DOI  :  10.1088/1742-6596/791/1/012038

来源: IOP

【 摘 要 】

In order to realize a commercial system with a user-friendly interface for positron annihilation lifetime (PAL) measurements, we have applied our previously developed anti-coincidence method to a compact system, controlled by dedicated software with a data analysis module. The functionality of the data-analysis code was confirmed by examining the reproducibility of input average lifetimes for calculated PAL histograms. A prototype for the commercial system was constructed and the validity of the analysis using the system was ensured by measuring a reference material.