Effect of oxygen partial pressure on the structural and optical properties of ion beam sputtered TiO2 thin films

International Conference on Recent Trends in Physics 2016

Tantray, Firdous A.^1 ; Chouhan, Romita^1 ; Rajput, Swati^2 ; Agrawal, Arpana^1 ; Andrews, Joseph T.^2 ; Sen, Pranay K.^2 ; Gupta, Mukul^3 ; Sen, Pratima^1

Nonlinear Optics Lab, Laser Bhawan, School of Physics, Devi Ahilya University, Indore

452001, India^1

Department of Applied Physics and Optoelectronics, Shri G.S. Institute of Science and Technology, Indore

452003, India^2

UGC-DAE Consortium for Scientific Research, Khandwa road, Indore

452001, India^3

关键词: Crystalline nature;    Effect of oxygen;    Glass substrates;    Non-linear optical properties;    Nonlinear refractive index;    Oxygen partial pressure;    Structural and optical properties;    Z-scan experiment;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/755/1/012053/pdf
DOI  :  10.1088/1742-6596/755/1/012053

来源: IOP

【 摘 要 】

We report the effect of oxygen partial pressure on the structural, electronic and nonlinear optical properties of ion beam sputtered TiO2thin films deposited on glass substrate at 40% of oxygen (S1) and 20% of oxygen (S2) partial pressure. XRD data shows the crystalline nature of S1 film while the film S2 was amorphous in nature. The energy band gap of the thin films calculated from their UV-Vis spectra was found to be 3.63 eV (S1) and 3.56 eV (S2). The decrease in the band gap with decrease in oxygen partial pressure may be attributed to the amorphous nature of the film. The nonlinear refractive indices for both the films were obtained from the closed aperture Z-scan experiment performed using a cw He-Ne laser source operating at 632.8 nm and were found to be 17.6×10-9m2/W and -5.64×10-9m2/W for S1and S2 films, respectively. The reversal in the sign of the nonlinear refractive index may also be ascribed to the crystallinity of the grown films.