XRD and XANES study of some Cu-doped MnBi materials

International Conference on Recent Trends in Physics 2016

Mishra, Ashutosh^1 ; Patil, Harsha^1

School of Physics, Devi Ahilya University, Indore

452001, India^1

关键词: Absorption edges;    Absorption maxima;    Fast counting;    Local structure;    Low temperature phase;    X ray diffractometers;    X-ray absorption near-edge structure;    X-ray diffraction measurements;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/755/1/012017/pdf
DOI  :  10.1088/1742-6596/755/1/012017

来源: IOP

【 摘 要 】

High purity MnBi low temperature phase has been prepared and analyzed using X- ray diffraction (XRD) and X-ray absorption near edge structure (XANES) measurements. The X-ray diffraction measurements were carried out using Bruker D8 Advance X-ray diffractometer. The X-rays were produced using a sealed tube and the wavelength of X-ray was 154 nm (Cu K-alpha). and X-rays were detected using a fast counting detector based on Silicon strip technology (Bruker LynxEye detector)[1]. and the X-ray absorption spectra has emerged as a powerful technique for local structure determination, which can be applied to any type of material. The X-ray absorption measurements of two Cu-doped MnBi alloys have been performed at the recently developed BL-8 Dispersive EXAFS beam line at 2.5 GeV Indus-2 synchrotron at RRCAT, Indore, India[2]. The X-ray absorption near edge structure (XANES) data obtained has been processed using data analysis program Athena. The energies of the K absorption edge, chemical shifts, edge-widths, shifts of the principal absorption maximum in the alloys have been determined.