Development and calibration of a MFM-based system for local hysteresis loops measurements

International Conference on Recent Trends in Physics 2016

Coïsson, M.^1 ; Barrera, G.^1 ; Celegato, F.^1 ; Tiberto, P.^1

INRIM, Strada Delle Cacce 91, 10135 Torino (TO), Italy^1

关键词: Applied field;    End-of-line;    Field evolution;    Local hysteresis loops;    Magnetic dots;    Magnetic force microscopes;    Measurement techniques;    MFM image;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/755/1/012002/pdf
DOI  :  10.1088/1742-6596/755/1/012002

来源: IOP

【 摘 要 】

A measurement technique derived from a field-dependent magnetic force microscope (MFM) is presented for the measurement of local hysteresis loops on patterned micrometric and sub-micrometric magnetic structures. The technique exploits the synchronisation of the applied field variations with the end-of-line signal of the microscope, while keeping the slow scan axis disabled. In this way, a single MFM image contains the whole field evolution of the magnetisation processes in the sample along a user-defined profile. An analysis procedure is presented for the subsequent determination of local hysteresis loops on magnetic dots. The system has been calibrated for what concerns the applied field values. No significant artifacts induced in the measurements by the applied field have been observed up to applied fields of ≈ 1000 Oe.