Per-pixel adjustment of the afterglow effect EOC screen.

3rd International School and Conference on Optoelectronics, Photonics, Engineering and Nanostructures (Saint Petersburg OPEN 2016)

Borodina, K.A.^1 ; Sorokina, S.A.^1 ; Bebiya, A.G.^1 ; Boronenko, M.P.^1 ; Gulyaev, P. Yu^1

Ugra State University, Chehov st. 16, Khanty-Mansiysk

628012, Russia^1

关键词: Measuring systems;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/741/1/012139/pdf
DOI  :  10.1088/1742-6596/741/1/012139

来源: IOP

【 摘 要 】

Information capacity of optoelectronic measuring systems significantly exceeds the volume of the others. The residual afterglow EOC creates additional uncertainty. There is a partial solution to the problem [1-2]. The work is dedicated to the enhancement of existing methods to fight the afterglow.