Scanning near-field microscopy of microdisk resonator with InP/GalnP quantum dots using cantilever-based probes

3rd International School and Conference on Optoelectronics, Photonics, Engineering and Nanostructures (Saint Petersburg OPEN 2016)

Shelaev, A.V.^1 ; Mintairov, A.M.^2,3 ; Dorozhkin, P.S.^1,4 ; Bykov, V.A.^1

NT-MDT Co., 100 Zelenograd, Moscow

124482, Russia^1

Ioffe Institute, Saint Petersburg

194021, Russia^2

University Notre Dame, Notre Dame

IN

46556, United States^3

Skolkovo Institute of Science and Technology, Skolkovo Innovation Center, Moscow

143026, Russia^4

关键词: Cantilever probe;    InP quantum dots;    Light diffraction;    Micro-objectives;    Microdisk resonators;    Quality factors;    Scanning near field microscopy;    Spatial resolution;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/741/1/012132/pdf
DOI  :  10.1088/1742-6596/741/1/012132

来源: IOP

【 摘 要 】

We present cantilever-probe based scanning near-field microscopy (SNOM) studies of GaInP microdisks resonators (radii R=2 um and quality factors Q∼1000) with embedded InP quantum dots (QDs) emitting at ∼750 nm. Near-field photoluminescence spectroscopy in collection regime, using side excitation from micro-objective, was used for imaging of whispering-gallery modes (WGMs) with a spatial resolution below the light diffraction limit. Using collection-illumination regime we imaged the position of single InP/GaInP QDs in microdisk.