Precise baseline correction using statistical criteria in the measurement of characteristics of laser beams

5th International Conference of Photonics and Information Optics

Matsak, I.S.^1 ; Kapranov, V.V.^1 ; Tugaenko, V.Y.^1 ; Kudryavtsev, E.M.^2

S.P. Korolev Rocket and Space Corporation Energia, 4a Lenin street, Korolev, Moscow area

141070, Russia^1

National Research Nuclear University MEPhI, Moscow Engineering Physics Institute, Kashirskoe shosse 31, Moscow

115409, Russia^2

关键词: Baseline correction;    Beam measurements;    Instrumental error;    Methodical errors;    Precise measurements;    Statistical criterion;    Uneven illuminations;    Wide-aperture lasers;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/737/1/012068/pdf
DOI  :  10.1088/1742-6596/737/1/012068

来源: IOP

【 摘 要 】

Laser beam measurement using transmissive diffusion screen is the most appropriate method for wide aperture laser beams. Precise measurement requires minimizing the instrumental and methodical errors. Structure of instrumental errors and its reducing were considered in works [1,2]. In this work the method of precise baseline correction is discussed, which allow to reduce methodical error and to avoid clangers caused by highlights and uneven illumination.