NIST on a Chip: Realizing SI units with microfabricated alkali vapour cells

8th Symposium on Frequency Standards and Metrology 2015

Kitching, J.^1 ; Donley, E.A.^1 ; Knappe, S.^1 ; Hummon, M.^1 ; Dellis, A.T.^1 ; Sherman, J.^1 ; Srinivasan, K.^2 ; Aksyuk, V.A.^2 ; Li, Q.^2 ; Westly, D.^2 ; Roxworthy, B.^2 ; Lal, A.^3

Time and Frequency Division, National Institute of Standards and Technology, Boulder

CO, United States^1

Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, United States^2

Department of Electrical and Computer Engineering, Cornell University, Ithaca

NY, United States^3

关键词: Alkali atoms;    Chip scale;    In-situ calibration;    International system;    Low costs;    Microfabricated;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/723/1/012056/pdf
DOI  :  10.1088/1742-6596/723/1/012056

来源: IOP

【 摘 要 】

We describe several ways in which microfabricated alkali atom vapour cells might potentially be used to accurately realize a variety of International System (SI) units, including the second, the meter, the kelvin, the ampere, and the volt, in a compact, low-cost "chip-scale" package. Such instruments may allow inexpensive in-situ calibrations at the user's location or widespread integration of accurate references into instrumentation and systems.