Yoneda-XAFS with Area X-Ray Detectors

16th International Conference on X-ray Absorption Fine Structure

Gasse, J.-C.^1 ; Lützenkirchen-Hecht, D.^1 ; Wagner, R.^1 ; Frahm, R.^1

Bergische Universität Wuppertal, Gaußstr. 20, Wuppertal

42097, Germany^1

关键词: Area detectors;    Diffuse scattering;    Fine structures;    Scattering pattern;    Simultaneous measurement;    Structure information;    Surface and interfaces;    Surface sensitive methods;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/712/1/012028/pdf
DOI  :  10.1088/1742-6596/712/1/012028

来源: IOP

【 摘 要 】

ReflXAFS is a well-known, surface sensitive method to investigate the structure of e.g. thin films. By a proper choice of incident and exit angles the Yoneda-peak, a distinct intensity maximum in the diffuse scattering, becomes visible. For multilayered samples, several Yoneda-peaks related to surface and interface regions may be observed. It is possible to utilize these peaks to measure the fine structure of an element inside the related surface and interface regions of a multi-layered sample. We will show that the use of 2D-area detectors allow the simultaneous measurement of the entire scattering pattern for each energy in an EXAFS spectrum, providing access to detailed in-situ structure information of the surface and interface regions in multilayered samples.