Improvement of the efficient referencing and sample positioning system for micro focused synchrotron X-ray techniques

16th International Conference on X-ray Absorption Fine Structure

Spangenberg, T.^1 ; Göttlicher, J.^1 ; Steininger, R.^1

Karlsruhe Institute of Technology, ANKA Synchrotron Radiation Facility, Hermann-von-Helmholtz-Platz 1, Eggenstein-Leopoldshafen

76344, Germany^1

关键词: Beam lines;    Command line;    Direct control;    Micro focus;    Positioning system;    Synchrotron x-ray technique;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/712/1/012014/pdf
DOI  :  10.1088/1742-6596/712/1/012014

来源: IOP

【 摘 要 】

An efficient referencing and sample positioning system is a basic tool for a micro focus beamline at a synchrotron. The seven years ago introduced command line based system was upgraded at SUL-X beamline at ANKA [1]. A new combination of current server client techniques offers direct control and facilitates unexperienced users the handling of this frequently used tool.