Local flux intrusion in HTS annuli during pulsed field magnetization

9th International Workshop on Processing and Applications of Superconducting (RE)BCO Large Grain Materials

物理学;材料科学

Korotkov, V.S.^1 ; Krasnoperov, E.P.^1,2 ; Kartamyshev, A.A.^1

National Research Center Kurchatov Institute, Kurchatov Square 1, Moscow

123182, Russia^1

Moscow Institute of Physics and Technology, Institutskiy Pereulok, 9, Dolgoprudniy

141700, Russia^2

关键词: Circular current;    High critical current densities;    Melt-grown;    Pulsed fields;    Pulsed-field magnetization;    Shielding currents;    Temperature relaxation;    Trapped field;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/695/1/012007/pdf
DOI  :  10.1088/1742-6596/695/1/012007

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

During pulsed field magnetization of melt-grown HTS flux jumps can occur and the shielding current falls by 10-20 times. As the duration of pulse is shorter than the temperature relaxation time (cregion) is estimated to be ∼ 7 deg.