Structural, electrical and magnetic study of manganites Pr0.6Sr0.4MnO3 thin films

17th Russian Youth Conference on Physics of Semiconductors and Nanostructures, Opto- and Nanoelectronics

Neznakhin, D.S.^1 ; Samoshkina, Yu.E.^2 ; Molokeev, M.S.^2 ; Semenov, S.V.^2

Ural Federal University, Ekaterinburg

620000, Russia^1

L.V. Kirensky Institute of Physics SB RAS, Krasnoyarsk

660036, Russia^2

关键词: Field dependence;    Magnetic studies;    Magnetization temperature curves;    Polycrystalline phase;    Resistivity dependence;    Shape characteristics;    Structural parameter;    Zero-field cooling;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/690/1/012002/pdf
DOI  :  10.1088/1742-6596/690/1/012002

来源: IOP

【 摘 要 】

Thin polycrystalline Pr0.6Sr0.4MnO3films were grown on the Y stabilized zirconium oxide substrates by magnetron sputtering using RF power and off-axis sputtering scheme with double cathodes. Only one polycrystalline phase with structural parameters consistent with that for the corresponding bulk sample was revealed in the films. Electric resistivity dependence on temperature demonstrates the shape characteristic for the substances with the Mott transition. The difference between magnetization temperature curves measured in the zero field cooling and field cooling modes was revealed. Magnetization field dependences were presented by the hysteresis loops changing their form with temperature.