Low-temperature thermal expansion measurements in PrV2Al20

TMU International Symposium on "New Quantum Phases Emerging from Novel Crystal Structure"

Magata, A.^1 ; Matsumoto, Y.^1 ; Tsujimoto, M.^1 ; Tomita, T.^1 ; Kiichler, R.^2 ; Sakai, A.^3 ; Nakatsuji, S.^1

Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba, Japan^1

Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Strasse 40, Dresden

01187, Germany^2

Universtät Augsburg, Universitätsstrasse 2, Augsburg

86159, Germany^3

关键词: Crystal electric field;    Linear thermal expansion coefficients;    Linear thermal expansions;    Low temperature thermal expansion;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/683/1/012014/pdf
DOI  :  10.1088/1742-6596/683/1/012014

来源: IOP

【 摘 要 】

We have measured thermal expansion of PrV2Al20and LaV2Al20from room temperature down to 2 K, using a capacitance dilatometer. Linear thermal expansion ΔL/L along [111] direction decreases monotonically on cooling in both materials. The extracted 4 electrons contribution of the linear thermal expansion coefficient a clearly shows a broad peak at ∼ 30 K which may correspond to the crystal electric field excited state at 40 K suggested in the previous specific heat study.