Direct phase extraction of self-mixing displacement measurement using Hilbert transform

5th International Conference on Advances in Optoelectronics and Micro/Nano-optics

Tao, Yufeng^1 ; Wang, Ming^1 ; Guo, Dongmei^1 ; Zhang, Jiahuan^1

Department of Physics Science and Technology, Nanjing Normal University, Jiangsu Key Laboratory on Opto-electronic Technology, Nanjing

210023, China^1

关键词: Analysis and simulation;    High resolution;    Hilbert transform;    Phase conditions;    Phase extraction;    Phase information;    Self mixing interference;    Self-mixing interferometers;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/680/1/012035/pdf
DOI  :  10.1088/1742-6596/680/1/012035

来源: IOP

【 摘 要 】

Signals of a self-mixing interferometer established on a semiconductor laser diode are analyzed. Phase is extracted out for decoding measurement which contained in self-mixing fringes. The semiconductor laser diode works as light source and receiver without modulation. By combining Hilbert transform with phase condition of self-mixing interference, micron- displacement is reconstructed by phase information at week or even moderate feedback level. Theoretical analysis and simulation results are presented before verification of experimental measurement. Practical feedback level is estimated by a data fitting technique with a programmable high-resolution PZT. Consistence of the results promises that direct phase extraction on self-mixing interferometer is available for micron-displacement measurement with a nanometer accuracy.