Study of humidity on the structure and optical properties of cesium iodide thin film

5th International Conference on Advances in Optoelectronics and Micro/Nano-optics

Liang, Bo^1 ; Liu, Shuang^1 ; Guo, Lina^1 ; Chen, Dejun^1 ; Liu, Yong^1 ; Zhong, Zhiyong^2 ; Xiong, Liufeng^3

University of Electronic Science and Technology of China, School of Optoelectronic Information, Chengdu, China^1

University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu, China^2

XL Innovative Technologies, Cleveland

OH

44111, United States^3

关键词: Absorption peaks;    Band centers;    Infrared spectrum;    Long term exposure;    Polycrystalline structure;    Preferential growth orientation;    Wave numbers;    X-ray diffusions;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/680/1/012022/pdf
DOI  :  10.1088/1742-6596/680/1/012022

来源: IOP

【 摘 要 】

We report the influence of 70% 5% humid exposed air at room temperature on the structure of 500nm thick CsI film. By means of scanning electron microscopy (SEM) and X- ray diffusion (XRD) analysis, the surface morphology and polycrystalline structure were investigated. After 24 hour exposure to humid air, the grain size of CsI film has a drastic change, and so as to the preferential growth orientation. Infrared spectra showed a hydroxyl absorption peak after 3h exposure. And in long term exposure (24h), the absorption peak broadened with the band center shifting toward lower wavenumbers.