Sub-millimeter arbitrary arrangements of monolithically micro-scale electrical double layer capacitors

15th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications

物理学;能源学

Laszczyk, Karolina U.^1 ; Kazufumi, Kobashi^1,2 ; Sakurai, Shunsuke^1,2 ; Sekiguchi, Atsuko^1,2 ; Futaba, Don N.^1,2 ; Yamada, Takeo^1,2 ; Hata, Kenji^1,2

Technology Research Association for Single Wall Carbon Nanotubes (TASC), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki

305-8565, Japan^1

National Institute of Advanced Industrial Science and Technology (AIST), CNT-Application Research Center, Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki

305-8565, Japan^2

关键词: Electrical circuit;    Electrical double layer capacitor;    Electrochemical measurements;    Individual cells;    Mesh structures;    Operational voltage;    Performance uniformity;    Reproducibilities;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/660/1/012086/pdf
DOI  :  10.1088/1742-6596/660/1/012086

来源: IOP

【 摘 要 】

We report the investigation on the reproducibility of micro-scale electric double layer capacitors (micro-EDLCs). The micro-EDLC components were fabricated parallel using photolithography, wet and dry processing. Electrodes of the micro-EDLCs are highly dense packed Single Wall Carbon Nanotubes (SWCNTs) that form a mesh structure. The micro- EDLCs are connected 1-10 in series and in parallel being unified electrical circuits to tune the capacitance and the operational voltage. To confirm the reproducibility of the cells as well as the yield we performed electrochemical measurements in order to define the performance uniformity between cells strings and individual cells connected in a string. For 1-10 cells in series and in parallel the trends for the capacitance and operational voltage satisfied electrophysics rules governing cells addition. However, the measurements of the individual cells in a string revealed the significant performance discrepancy that might result in a shorten life cycling of a circuit.