X-pinch soft x-ray source dynamics at a subnanosecond time resolution

30th International Conference on Interaction of Intense Energy Fluxes with Matter

Artyomov, A.P.^1 ; Fedunin, A.V.^1 ; Chaikovsky, S.A.^2 ; Ratakhin, N.A.^1

Institute of High Current Electronics, Siberian Branch, Russian Academy of Sciences, Akademichesky Avenue 2/3, Tomsk

634055, Russia^1

Lebedev Physical Institute, Russian Academy of Sciences, Leninsky Avenue 53, Moscow

119991, Russia^2

关键词: Compact generators;    Current amplitude;    Current rise time;    Radiation pulse;    Soft x-ray sources;    Sub nanoseconds;    Time resolution;    X-ray imaging techniques;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/653/1/012144/pdf
DOI  :  10.1088/1742-6596/653/1/012144

来源: IOP

【 摘 要 】

The paper reports on an experimental study of the X-pinch soft x-ray source dynamics at a subnanosecond time resolution with the use of an x-ray imaging technique based on an AXIS-NX streak camera. The study was performed on a compact generator with a current amplitude of 300 kA to a short-circuit load and current rise time of 180 ns. It is shown that in the spectral range 1-1.55 keV, the X-pinch soft x-ray source in whole represents a set of sources which can be radially offset by ∼ 10 microns about the X-pinch axis. Each of the sources generates a pulse of duration 0.2-0.7 ns. The interval between the formation of the sources and hence between their radiation pulses is 0.5 ns and longer.