Weak measurement from the electron displacement current: new path for applications

19th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures

Marian, D.^1,2 ; Colomés, E.^1 ; Zanghí, N.^2 ; Oriols, X.^1

Departament d'Enginyeria Electrónica, Universitat Autónoma de Barcelona, Bellaterra

08193, Spain^1

Dipartimento di Fisica, Dell'Universitá di Genova, INFN Sezione di Genova, Genova

16146, Italy^2

关键词: Bohmian trajectories;    Displacement components;    Displacement currents;    Double-slit experiment;    Electronic systems;    Electronics technology;    Nanoelectronic devices;    Quantum engineering;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/647/1/012024/pdf
DOI  :  10.1088/1742-6596/647/1/012024

来源: IOP

【 摘 要 】

The interest on weak measurements is rapidly growing during the last years as a unique tool to better understand and predict new quantum phenomena. Up to now many theoretical and experimental weak-measurement techniques deal with (relativistic) photons or cold atoms, but there is much less investigation on (non-relativistic) electrons in up-to-date electronics technologies. We propose a way to perform weak measurements in nanoelectronic devices through the measurement of the total current (particle plus displacement component) in such devices. We study the interaction between an electron in the active region of a electron device with a metal surface working as a sensing electrode by means of the (Bohmian) conditional wave function. We perform numerical (Monte Carlo) simulations to reconstruct the Bohmian trajectories in the iconic double slit experiment. This work opens new paths for understanding the quantum properties of an electronic system as well as for exploring new quantum engineering applications in solid state physics.