Atomic-scale insights into 1D and 2D nano-materials

Electron Microscopy and Analysis Group Conference 2015

Bangert, U.^1 ; Pierce, W.^2 ; Boothroyd, C.B.^3 ; Migliorato, M.^4 ; Pan, C.-T.^2 ; Harvey, A.J.^1 ; Kepatsoglou, D.M.^5 ; Ramasse, Q.M.^5

Department of Physics and Energy, University of Limerick, Limerick, Ireland^1

School of Materials, University of Manchester, Manchester

M13 9PL, United Kingdom^2

Emst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Peter Gruenberg Institute Juelich Research Centre, Juelich

D-52425, Germany^3

School of Electrical and Electronic Engineering, University of Manchester, Manchester

M13 9PL, United Kingdom^4

SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury

WA4 4AD, United Kingdom^5

关键词: Aberration-corrected;    Atomic scale imaging;    Atomic-resolution imaging;    Dielectric theory;    Electronic band structure;    Lattice impurities;    Low energy ion implantation;    Transmission electron;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/644/1/012021/pdf
DOI  :  10.1088/1742-6596/644/1/012021

来源: IOP

【 摘 要 】

Atomic resolution imaging and narrow-energy spread spectroscopy in aberration corrected (scanning) transmission electron microscopes, in combination with DFT modelling has made it possible to uncover atomic-scale morphology, defect constellations, lattice impurities and ad-atoms in nano-materials, as well as revealing their influence on the surrounding bandstructure. Using atomic-scale imaging, EEL spectroscopy and EFTEM, we address issues beyond the more common investigations of their atomic lattice structure. We focus on the demonstration of (i) ripples in graphene and on effects of (ii) metal ad-atoms as well as of (iii) controllably introduced impurities -via low energy ion implantation- in both, graphene and carbon nanotubes, on the electronic band structure. We demonstrate the creation of a new feature with collective charge carrier behaviour (plasmon) in the UV/vis range in graphene and carbon nanotubes via EEL spectrum imaging and EFTEM, and support this with dielectric theory modelling.