Extracting S-parameters of bilateral electro-optic network for lightwave component analyzer calibration

2nd International School and Conference Saint-Petersburg OPEN on Optoelectronics, Photonics, Engineering and Nanostructures

Frolov, D.^1 ; Levchenko, A.^1 ; Korotkov, K.^1

Kuban State University, 149 Stavropolskaya st., Krasnodar, Russia^1

关键词: Calibration techniques;    Electro-optical;    Heterodyne technique;    Lightwave component analyzers;    Microwave network analyzer;    Optical load;    Optical ports;    Two mirrors;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/643/1/012062/pdf
DOI  :  10.1088/1742-6596/643/1/012062

来源: IOP

【 摘 要 】

A new method for extracting E/O and O/E S-parameters of a bilateral electro-optic network (BEON) is theoretically proposed. It is based on measuring reflection coefficients from three optical loads: an absorber and two mirrors. This technique includes two series of reflections measurements: first when loads are connected to optical port of BEON directly and second when loads are connected in series with optical waveguide of fixed length. Using two BEONs and this calibration technique allows to make calibrated lightwave measurements with a standard microwave network analyzer without using additional electro-optical equipment such as lightwave component analyzer or optical heterodyne techniques.