Subminiature eddy current transducers for studying semiconductor material

2nd International School and Conference Saint-Petersburg OPEN on Optoelectronics, Photonics, Engineering and Nanostructures

Dmitriev, S.F.^1 ; Malikov, V.N.^1 ; Sagalakov, A.M.^1 ; Shevtsova, L.I.^2 ; Katasonov, A.O.^1

Altai State University, Lenina avenue, 61, Altai region, Barnaul

656049, Russia^1

Novosibirsk State Technical University, 20 K.Marx Prospekt, Novosibirsk

Oblast, Russia^2

关键词: Eddy current transducers;    High confinement;    Initial permeability;    Semiconductor plates;    Small area;    Structural diagram;    Technical data;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/643/1/012058/pdf
DOI  :  10.1088/1742-6596/643/1/012058

来源: IOP

【 摘 要 】

Based on an eddy-current transducer (ECT), a probe has been designed to study the semiconductor material. The structural diagram of the probe is given and the basic technical data are stated (the number of windings is 10-130 turns, and the value of the initial permeability of the core μ max = 500). Due to the high confinement of the magnetic field, it is possible to acquire data from small areas of semiconductor plates. Response versus ECT positioning diagram is also provided.