Can angle-resolved x-ray measurements help determine small level splittings in highly charged ions?

29th International Conference on Photonic, Electronic, and Atomic Collisions

Wut, Z.W.^1,2 ; Kabachnik, N.M.^3,4 ; Surzhykov, A.^1 ; Dong, C.Z.^2 ; Fritzscheh, S.^1,5

Helmholtz-Institut Jena, Fröbelstieg 3, Jena

D-07743, Germany^1

Key Laboratory of Atomic and Molecular Physics and Functional Materials of Gansu Province, China^2

European XFEL, Albert-Einstein-Ring 19, Hamburg

D-22761, Germany^3

Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, Moscow

119991, Russia^4

Theoretisch-Physikalisches Institut, Friedrich-Schiller-Universität Jena, Jena

D-07743, Germany^5

关键词: Angle-resolved;    Angular correlations;    Highly charged ions;    Measurements of;    Radiative cascades;    Splittings;    X ray measurements;    X-ray emission;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/9/092030/pdf
DOI  :  10.1088/1742-6596/635/9/092030

来源: IOP

【 摘 要 】

The angular distribution and photon-photon angular correlation have been studied for x-ray emissions from two-step radiative cascades that proceed via two or more overlapping intermediate resonances. From this study, we suggest that accurate angle-resolved measurements of the x-ray emissions may serve as a tool for determining small level splittings in excited highly-charged ions.