会议论文详细信息
29th International Conference on Photonic, Electronic, and Atomic Collisions
Intra-cavity photodetachment microscopy and the electron affinity of germanium
Blondel, Christophe^1 ; Bresteau, David^1 ; Drag, Cyril^1
Laboratoire Aimé-Cotton, Centre National de la Recherche Scientifique, Université Paris-sud, École Normale Supérieure de Cachan, Bâtiment 505, Orsay Cedex
F-91405, France^1
关键词: Centrifugal barriers;    Interferograms;    Intracavities;    Optical cavities;    Optical modes;    Photo-detachment;    Photodetachment cross section;    Photodetachment microscopy;   
Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/9/092010/pdf
DOI  :  10.1088/1742-6596/635/9/092010
来源: IOP
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【 摘 要 】

Photodetachment microscopy is performed inside an optical cavity, on an ion beam and with an optical mode narrow enough not to blur out the output electron interferogram. This setting is used for an updated measurement of the electron affinity of germanium. Amplification of the photodetachment probability obtained in an optical cavity also opens the way to photodetachment microscopy with a p electron wave, even though photodetachment cross-sections are reduced considerably in this case, when compared to s-wave detachment, by the centrifugal barrier.

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