Generalized oscillator strengths for the valence-shell excitations of xenon studied by the high-resolution fast-electron impact

29th International Conference on Photonic, Electronic, and Atomic Collisions

Liu, Ya-Wei^1,2 ; Xu, Long-Quan^1,2 ; Zhu, Lin-Fan^1,2

Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui

230026, China^1

Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui

230026, China^2

关键词: Fast-electron energy-loss spectrometer;    Fast-electron impact;    Generalized oscillator strength;    High resolution;    Incident electrons;    Momentum transfer dependence;    Valence shells;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/5/052030/pdf
DOI  :  10.1088/1742-6596/635/5/052030

来源: IOP

【 摘 要 】

Using the high-resolution fast-electron energy loss spectrometer, the generalized oscillator strengths (GOSs) of the valence-shell excitations of xenon were determined at a high resolution of 70 meV and a high incident electron energy of 1500 eV, and the momentum transfer dependence behaviors of GOSs of the 6s[3/2]1and 6s'[1/2]1excitations of xenon are discussed.