Electron-DDCS Measurements of Water by C and Si Ion beams

29th International Conference on Photonic, Electronic, and Atomic Collisions

Bhattacharjee, S.^1 ; Biswas, S.^1 ; Kasthurirangan, S.^1 ; Rivaro, R.D.^2 ; Monti, J.M.^2 ; Tachino, C.A.^2 ; Tribedi, L.C.^1

Tata Institute of Fundamental Research, Homi Bhabha Road, Colaba, Mumbai

400 005, India^1

Institute de Fisica Rosario (CONICET-UNR), Universidad Nacional de Rosario, Rosario

2000, Argentina^2

关键词: Double differential;    Measurements of;    Si ions;    Single-differential cross sections;    State of the art;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/635/3/032104/pdf
DOI  :  10.1088/1742-6596/635/3/032104

来源: IOP

【 摘 要 】

Double differential distributions of electron emission from H2O target under the impact of C6+and Si13+ions with energy 4 MeV/u have been measured. The state-of-the art CDW-EIS model provided a good agreement with the data for C-ions whereas a substantial deviation is found for the Si ions. The derived single differential cross sections and total cross sections were also compared with different models.