Influence of anisotropy on percolation and jamming of linear k-mers on square lattice with defects

4th International Conference on Mathematical Modeling in Physical Sciences

物理学;数学

Tarasevich, Yu.^1 ; Laptev, V.V.^1,2 ; Burmistrov, A.S.^1 ; Shinyaeva, T.S.^1

Astrakhan State University, 20a Tatishchev Street, Astrakhan

414056, Russia^1

Astrakhan State Technical University, 16 Tatishchev Street, Astrakhan

414025, Russia^2

关键词: Critical defects;    Defect concentrations;    Deposited layer;    Elongated objects;    External fields;    Percolation thresholds;    Random sequential adsorption;    Square lattices;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/633/1/012064/pdf
DOI  :  10.1088/1742-6596/633/1/012064

来源: IOP

【 摘 要 】

By means of the Monte Carlo simulation, we study the layers produced by the random sequential adsorption of the linear rigid objects (k-mers also known as rigid or stiff rods, sticks, needles) onto the square lattice with defects in the presence of an external field. The value of k varies from 2 to 32. The point defects randomly and uniformly placed on the substrate hinder adsorption of the elongated objects. The external field affects isotropic deposition of the particles, consequently the deposited layers are anisotropic. We study the influence of the defect concentration, the length of the objects, and the external field on the percolation threshold and the jamming concentration. Our main findings are (i) the critical defect concentration at which the percolation never occurs even at jammed state decreases for short k-mers (k16) as anisotropy increases, (ii) the corresponding critical k-mer concentration decreases with anisotropy growth, (iii) the jamming concentration decreases drastically with growth of k-mer length for any anisotropy, (iv) for short k-mers, the percolation threshold is almost insensitive to the defect concentration for any anisotropy.