Uncertainty evaluation and electronic improvements of a wavemeter to measure the wavelength of an external cavity diode laser

23rd Congress of the International Commission for Optics

Outumuro, I.^1 ; Valencia, J.L.^1 ; Diz-Bugarin, J.^1 ; Blanco, J.^2 ; Dorrío, B.V.^2

RandD Department, Laboratorio Oficial de Metroloxía de Galicia (LOMG), Parque Tecnolóxico de Galicia, Ourense

32901, Spain^1

Applied Physics Department, University of Vigo, Campus Universitario, Vigo

36310, Spain^2

关键词: Counting device;    External-cavity diode laser;    Frequency reference;    Gauge block;    Interferometric system;    Littrow configuration;    Michelson;    Uncertainty evaluation;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/605/1/012018/pdf
DOI  :  10.1088/1742-6596/605/1/012018

来源: IOP

【 摘 要 】

A Michelson wavemeter was developed to test the accuracy and give traceability to the wavelength of external cavity diode lasers. These lasers were stabilized using a Littrow configuration and an iodine gas cell as frequency reference, and they were used as light sources in the assembly of a new interferometric system for the gauge block calibration. Previously, a microcontroller counting device with a Vernier logic and the uncertainty evaluation of the Michelson wavemeter had to be made.