Ion emission study using visible spectroscopy and ToF method in a plasma focus device of two kilojoules

15th Latin American Workshop on Plasma Physics; 21st IAEA TM on Research Using Small Fusion Devices

Moreno, J.^1,2 ; Morales, D.^3 ; Avaria, G.^1,2 ; Cuadrado, O.^4 ; Soto, L.^1,2

Comisión Chilena de Energía Nuclear, Chile^1

Center for Research and Applications in Plasma Physics and Pulsed Power, P4, Chile^2

Universidad Andrés Bello, Chile^3

Universidad Austral de Chile, Chile^4

关键词: Deuterium plasma;    Ion emissions;    Ionization level;    Neutron yields;    Particle emissions;    Plasma focus devices;    Time of flight;    Visible spectroscopy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/591/1/012023/pdf
DOI  :  10.1088/1742-6596/591/1/012023

来源: IOP

【 摘 要 】

Different studies have been developed in order to understand the dynamics and processes involved in the particle emission from plasma focus devices operating in the kilojoule range. The use of chemical compound gasses and noble gas mixtures has proven to produce different charged particles, as well as increase the neutron yield from deuterium plasma discharges. Nevertheless, the processes and parameters involved in these discharges are not fully understood. In this work we will present results of visible spectroscopy and "time-of- flight" observations of the different ion species and ionization levels obtained in a 2kJ plasma focus device, when using deuterium or hydrogen with small percentage impurities.