X-ray radiation influence on photoluminescence spectra of composite thin films based on C60

16th Russian Youth Conference on Physics of Semiconductors and Nanostructures, Opto- and Nanoelectronics

Elistratova, M.A.^1,2 ; Zakharova, I.B.^1 ; Romanov, N.M.^1,2

St. Petersburg Polytechnic University, 29 Polytechnicheskaya str., St.-Petersburg

195251, Russia^1

Lappeenranta University of Technology, 34 Skinnarilankatu, Lappeenranta

53850, Finland^2

关键词: Composite thin films;    Density functionals;    Energy dispersive X ray spectroscopy;    Molecular complexes;    Photoluminescence spectrum;    Quantum chemical calculations;    Secondary electron microscopy;    X ray irradiation;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/586/1/012002/pdf
DOI  :  10.1088/1742-6596/586/1/012002

来源: IOP

【 摘 要 】

Photoluminescence spectra of composite thin films based on C60 before and after X-ray irradiation, as well as the results of quantum-chemical calculations of corresponding molecular complexes are presented. Fullerene films doped by CdTe with various concentrations were obtained by means of vacuum co-evaporation in a Knudsen cell. Composition and surface morphology were measured by secondary electron microscopy and energy-dispersive X-ray spectroscopy. X-ray irradiated films were considered, and additional peaks in photoluminescence spectra were detected. These peaks appear as a result of molecular complexes formation from C60CdTe mixture and dimerization of the films. Density functional B3LYP quantum-chemical calculations for C60CdTe, molecular complexes, (C60)2 and C120O dimers were performed to elucidate some experimental results.