Line Shape Measurement and Modelling for Plasma Diagnostics

22nd International Conference on Spectral Line Shapes

Revalde, G.^1 ; Zorina, N.^2 ; Skudra, A.^3

Institute of Technical Physics, Riga Technical University, Azenes str. 14/24, Riga, Latvia^1

Ventspils University College, Inzenieru str.101, Ventspils, Latvia^2

Institute of Atomic Physics and Spectroscopy, University of Latvia, Skunu str. 4, Riga

LV 1050, Latvia^3

关键词: Fabry-Perot spectrometer;    Fourier transform spectrometers;    High-resolution spectrometer;    Narrow spectral lines;    Regularization methods;    Theoretical modeling;    Wide spectral range;    Zeeman spectrometer;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/548/1/012034/pdf
DOI  :  10.1088/1742-6596/548/1/012034

来源: IOP

【 摘 要 】

In this paper we discuss different methods of narrow spectral line shape measurements for a wide spectral range by means of high-resolution spectrometers such as the Fabry-Perot spectrometer, Zeeman spectrometer and Fourier transform spectrometer as well as a theoretical model for spectral line shape modelling and solving of the inverse task based on Tikhonov's regularization method. Special attention is devoted to the line shape measurements for the optically thin light sources filled with Hg, Ar, Xe, Kr for their use in high precision analysers for detection of heavy metals and benzene.