Neutron diffraction studies of a high resolution double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals in symmetric and fully asymmetric diffraction geometry, respectively

International Workshop on Neutron Optics and Detectors

Mikula, P.^1 ; Vrána, M.^1 ; Seong, B.S.^2 ; Woo, W.^2 ; Em, V.^3 ; Korytár, D.^4

Nuclear Physics Institute ASCR, V.v.i., 25068 Rez, Czech Republic^1

Neutron Science Division, KAERI, 1045 Daedok daero, Yuseong-gu, Daejeon, 305353, Korea, Republic of^2

National Research Centre, Kurchatov Institute, Moscow, 123182, Russia^3

Institue of Physics SAS, Dubravská cesta 9, 845 11 Bratislava, Slovakia^4

关键词: Beam expansion;    Bent perfect crystals;    Diffraction property;    Double crystals;    High resolution;    Large cross-sections;    Monochromatic beam;    Neutron diffraction studies;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/528/1/012004/pdf
DOI  :  10.1088/1742-6596/528/1/012004

来源: IOP

【 摘 要 】

In this paper studies of neutron diffraction properties of the double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals (BPC) in symmetric and fully asymmetric diffraction (FAD) geometry with the output beam expansion (OBE), respectively, are presented. Namely, our attention was focused on the properties of the FAD geometry of the BPC Si(311) crystal slab. It has been found that after a beam expansion this FAD geometry can provide a monochromatic beam of a rather large cross-section and of very small divergence with some possible application use.