A methodology for the extraction of quantitative information from electron microscopy images at the atomic level

Electron Microscopy and Analysis Group Conference 2013

Galindo, P.L.^1 ; Pizarro, J.^1 ; Guerrero, E.^1 ; Guerrero-Lebrero, M.P.^1 ; Scavello, G.^1 ; Yáñez, A.^1 ; Núñez-Moraleda, B.M.^1 ; Maestre, J.M.^1 ; Sales, D.L.^2 ; Herrera, M.^2 ; Molina, S.I.^2

Departamento de Ingenieria Informatica, Escuela Superior de Ingenieria de Cadiz, Universidad de Cádiz, Campus Río San Pedro s/n, Puerto Real, CADIZ 11510, Spain^1

Departamento de Ciencia de Los Materiales e I.M. y Q.I., Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro s/n, Puerto Real, CADIZ 11510, Spain^2

关键词: 3D reconstruction;    Electron microscopy images;    High performance computing;    Image simulations;    Materials modelling;    Modelling and simulations;    Quantitative information;    Research groups;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012013/pdf
DOI  :  10.1088/1742-6596/522/1/012013

来源: IOP

【 摘 要 】

In this paper we describe a methodology developed at the University of Cadiz (Spain) in the past few years for the extraction of quantitative information from electron microscopy images at the atomic level. This work is based on a coordinated and synergic activity of several research groups that have been working together over the last decade in two different and complementary fields: Materials Science and Computer Science. The aim of our joint research has been to develop innovative high-performance computing techniques and simulation methods in order to address computationally challenging problems in the analysis, modelling and simulation of materials at the atomic scale, providing significant advances with respect to existing techniques. The methodology involves several fundamental areas of research including the analysis of high resolution electron microscopy images, materials modelling, image simulation and 3D reconstruction using quantitative information from experimental images. These techniques for the analysis, modelling and simulation allow optimizing the control and functionality of devices developed using materials under study, and have been tested using data obtained from experimental samples.