In-situ environmental (scanning) transmission electron microscopy of catalysts at the atomic level

Electron Microscopy and Analysis Group Conference 2013

Gai, P.L.^1,2,3 ; Boyes, E.D.^1,2,4

York JEOL Nanocentre, University of York, YO10 5DD York, United Kingdom^1

Department of Physics, University of York, YO10 5DD York, United Kingdom^2

Department of Chemistry, University of York, YO10 5DD York, United Kingdom^3

Department of Electronics, University of York, YO10 5DD York, United Kingdom^4

关键词: Aberration-corrected;    Catalytic reactions;    Controlled reaction conditions;    Controlled reactions;    Heterogeneous catalytic reactions;    Single atom dynamics;    Solid catalysts;    Supported metals;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012002/pdf
DOI  :  10.1088/1742-6596/522/1/012002

来源: IOP

【 摘 要 】

Observing reacting single atoms on the solid catalyst surfaces under controlled reaction conditions is a key goal in understanding and controlling heterogeneous catalytic reactions. In-situ real time aberration corrected environmental (scanning) transmission electron microscopy (E(S)TEM permit the direct imaging of dynamic surface and sub-surface structures of reacting catalysts. In this paper in-situ AC ETEM and AC ESTEM studies under controlled reaction environments of oxide catalysts and supported metal nanocatalysts important in chemical industry are presented. They provide the direct evidence of dynamic processes at the oxide catalyst surface at the atomic scale and single atom dynamics in catalytic reactions. The ESTEM studies of single atom dynamics in controlled reaction environments show that nanoparticles act as reservoirs of ad-atoms. The results have important implications in catalysis and nanoparticle studies.