Evaluation of structure models of Ho2PdSi3 using DAFS, inter alia at a satellite reflection

Workshop on Resonant Elastic X-ray Scattering in Condensed Matter 2013

Nentwich, M.^1 ; Zschornak, M.^1 ; Richter, C.^1,2 ; Meyer, D.C.^1

Institute of Experimental Physics, TU Bergakademie Freiberg, Leipziger Straße 23, 09599 Freiberg, Germany^1

DESY Photon Science, Notkestraße 85, 22607 Hamburg, Germany^2

关键词: Absorption edges;    Diffraction anomalous fine structures;    Magnetic behavior;    Satellite reflections;    Si atoms;    Structure models;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/519/1/012011/pdf
DOI  :  10.1088/1742-6596/519/1/012011

来源: IOP

【 摘 要 】

The compounds R2PdSi3, with R rare earth, exhibit a very interesting magnetic behavior with two phase transitions. Substituting one in four Si atoms by Pd in HoSi2 results in a modulation of the aristotype. There are several different variants discussed in literature about the nature of the modulation of this rare-earth compound. Two of the latest models were compared: a 2 × 2 × 1 layer and a 2 × 2 × 8 stack. The chosen method is Diffraction Anomalous Fine Structure (DAFS) and was applied both experimentally and by simulation at different absorption edges and reflections, i. a. a satellite reflection, aiming on finding the correct crystal structure.