Methods for the measurement of the refractive index of MeV photons using total internal and external reflection

RREPS13; Meghri13

Aginian, M.A.^1 ; Ispirian, K.A.^1 ; Ispiryan, M.^1

Alikhanian National Scientific Laboratory, Yerevan Physics Institute, Br. Alikhanians 2, Yerevan 0036, Armenia^1

关键词: External reflection;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/517/1/012045/pdf
DOI  :  10.1088/1742-6596/517/1/012045

来源: IOP

【 摘 要 】

Recently it has been theoretically and experimentally shown that for 1-10 MeV and 1-2 MeV photons, respectively, the refractive index of Si is greater than 1. Taking into account the difficulties of the carried out experiment it is proposed to measure directly the refractive index of Si and other materials detecting the total internal and external reflections.