X-Ray Cherenkov Radiation as a Source for Transverse Size Diagnostics of Ultra-relativistic Electron Beams

RREPS13; Meghri13

Konkov, A.S.^1 ; Karataev, P.V.^2 ; Potylitsyn, A.P.^1 ; Gogolev, A.S.^1

Tomsk Polytechnic University, Lenin Ave. 30, Tomsk, 634050, Russia^1

John Adams Institute at Royal Holloway, University of London, TW20 0EX, Egham, Surrey, United Kingdom^2

关键词: Cherenkov radiations;    Diffraction radiation;    Electron beam sizes;    Incident particles;    Noninvasive methods;    Quasi-monochromatic;    Transition radiation;    Ultra relativistic electrons;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/517/1/012003/pdf
DOI  :  10.1088/1742-6596/517/1/012003

来源: IOP

【 摘 要 】

Development of advanced non-invasive methods for charged particle beam diagnostics is crucial in modern and future accelerators. Therefore, it is essential to develop non-invasive methods to generate EM radiation which properties depend on the beam parameters. In this paper we propose to use X-ray Cherenkov radiation (XCR) which can be generated by ultrarelativistic charged particles in the vicinity of the absorption edges of several materials. Due to a resonant nature of the refractive index near the absorption edges the generated radiation is quasi-monochromatic. On the other hand its properties depend on the parameters of the incident particle beam. In this paper we represent an approach for calculating the XCR generated along with transition radiation and diffraction radiation. The effect of the transverse electron beam size on the XCR characteristics is discussed.