Upgrade of the Surface Spectrometer at NEPOMUC for PAES, XPS and STM Investigations

13th International Workshop on Slow Positron Beam Techniques and Applications

Zimnik, S.^1,2 ; Lippert, F.^1 ; Hugenschmidt, C.^1,2

Technische Universität München, Physik Department, Lehrstuhl E21, James-Franck-Straße, D-85748 Garching, Germany^1

Technische Universität München, Forschungs-Neutronenquelle Heinz Maier-Leibnitz, Lichtenbergstraße 1, D-85748 Garching, Germany^2

关键词: Atomic resolution;    Complementary methods;    Complementary techniques;    Elemental compositions;    Photoelectron spectroscopy (XPS);    Positron sources;    Surface electron density;    Surface topology;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/505/1/012003/pdf
DOI  :  10.1088/1742-6596/505/1/012003

来源: IOP

【 摘 要 】

The characterization of the elemental composition of surfaces is of great importance for the understanding of many surface processes, such as surface segregation or oxidation. Positron-annihilation-induced Auger Electron Spectroscopy (PAES) is a powerful technique for gathering information about the elemental composition of only the topmost atomic layer of a sample. The upgraded surface spectrometer at NEPOMUC (NEtron induced POsitron source MUniCh) enables a comprehensive surface analysis with the complementary techniques STM, XPS and PAES. A new X-ray source for X-ray induced photoelectron spectroscopy (XPS) was installed to gather additional information on oxidation states. A new scanning tunneling microscope (STM) is used as a complementary method to investigate with atomic resolution the surface electron density. The combination of PAES, XPS and STM allows the characterization of both the elemental composition, and the surface topology.