High energy-resolution electron energy-loss spectroscopy and soft-x-ray emission spectroscopy studies of amorphous diamond transformed from neutron-irradiated graphite

18th APS-SCCM; 24th AIRAPT

Sato, Y.^1 ; Terauchi, M.^1 ; Niwase, K.^2 ; Nakamura, K.G.^3 ; Atou, T.^3 ; Iwata, T.^4

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai

980-8577, Japan^1

Hyogo University of Teacher Education, Kato-shi, Hyogo

673-1494, Japan^2

Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama

226-8503, Japan^3

Japan Atomic Energy Research Institute, Ibaraki, Tokai

319-1195, Japan^4

关键词: High-energy resolution;    K-shell excitation;    Neutron irradiated;    Shock compressions;    Soft X ray emission spectroscopy;    Valence electron;    Valence electron density;    Wavelength Dispersive;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/500/19/192013/pdf
DOI  :  10.1088/1742-6596/500/19/192013

来源: IOP

【 摘 要 】

High energy-resolution electron energy-loss spectroscopy measurements were performed for amorphous diamond (am-DIA), which was synthesized from neutron-irradiated graphite by shock compression, by using a monochromator transmission electron microscope (TEM). Soft-X-ray emission spectroscopy (SXES) measurements were performed by a wavelength-dispersive type spectrometer attached to the monochromator TEM. A volume plasmon peak of am-DIA is observed at 32.5 eV, which is a little smaller than that of crystalline diamond (c-DIA). The smaller plasmon energy of am-DIA indicates a smaller valence electron density of am-DIA than that of c-DIA. From the onset energies of the K-shell excitation and the SXES spectra, the band gap energy of am-DIA is estimated to be 4 eV, which is similar to the value, 3.9 eV, from the valence electron excitation spectrum and reported values, 3.5-4.5 eV, for the am-DIA synthesized from C60fullerene by shock compression.