Structural properties of π-π conjugated network in polymer thin films studied by x-ray cross-correlation analysis

22nd International Congress on X-Ray Optics and Microanalysis

Kurta, R.P.^1 ; Grodd, L.^2 ; Mikayelyan, E.^2 ; Gorobtsov, O.Y.^1,3 ; Fratoddi, I.^4 ; Venditti, I.^5 ; Sprung, M.^1 ; Grigorian, S.^2 ; Vartanyants, I.A.^1,6

Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, D-22607 Hamburg, Germany^1

Department of Physics, University of Siegen, Walter-Flex-Strasse 3, D-57072 Siegen, Germany^2

National Research Center, Kurchatov Institute, Kurchatov Square 1, 123182 Moscow, Russia^3

Department of Chemistry, Center for Nanotechnology for Engineering (CNIS), University of Rome Sapienza, P.le A. Moro 5, I-00185 Rome, Italy^4

Department of Chemistry, University of Rome Sapienza, P.le A. Moro 5, I-00185 Rome, Italy^5

National Research Nuclear University, MEPhI, 115409 Moscow, Russia^6

关键词: Conjugated network;    Cross-correlation analysis;    Cross-correlation function;    Inhomogeneous structure;    Poly-3-hexylthiophene;    Polymer thin films;    Semi-crystalline polymer;    Structural ordering;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/499/1/012021/pdf
DOI  :  10.1088/1742-6596/499/1/012021

来源: IOP

【 摘 要 】

We present results of an x-ray study of structural properties of π-π conjugated networks in semicrystalline polymer thin films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) with gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders n = 2,4 and 6 revealing structural order in the system. The results suggest inhomogeneous structure of both samples, with preferential edge-on orientation of domains in one sample and mixed orientation in another sample.