Time-resolved soft X-ray microscopy of magnetic nanostructures at the P04 beamline at PETRA III

22nd International Congress on X-Ray Optics and Microanalysis

Wessels, P.^1 ; Ewald, J.^2 ; Wieland, M.^1 ; Nisius, T.^2 ; Abbati, G.^2 ; Baumbach, S.^2 ; Overbuschmann, J.^3 ; Vogel, A.^4 ; Neumann, A.^4 ; Viefhaus, J.^5 ; Oepen, H.P.^4 ; Meier, G.^4 ; Wilhein, T.^2 ; Drescher, M.^1

Institut für Experimentalphysik, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany^1

Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus, Joseph-Rovan-Allee 2, 53424 Remagen, Germany^2

Center of Advanced European Studies and Research (Caesar), Project Group Electron Microscopy and Analytics (EMA), Ludwig-Erhard-Allee 2, 53175 Bonn, Germany^3

Institut für Angewandte Physik, University of Hamburg, Jungiusstraße 11, 20355 Hamburg, Germany^4

Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany^5

关键词: Electric current pulse;    High-accuracy positioning;    Magnetic nanostructures;    Soft x-ray microscopy;    Synchrotron radiation source;    Time resolved measurement;    Transient magnetic fields;    X-ray magnetic circular dichroism;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/499/1/012009/pdf
DOI  :  10.1088/1742-6596/499/1/012009

来源: IOP

【 摘 要 】

We present first time-resolved measurements of a new mobile full-field transmission microscope [1] obtained at the soft X-ray beamline P04 at the high brilliance synchrotron radiation source PETRA III. A nanostructured magnetic permalloy (Ni80Fe20) sample can be excited by the magnetic field of a 400 ps full width at half maximum (FWHM) long electric current pulse in a coplanar waveguide. The full-field soft X-ray microscope successively probes the time evolution of the sample magnetization via X-ray magnetic circular dichroism (XMCD) [2] spectromicroscopy in a pump-probe scheme by varying the delay between pump and probe pulses electronically. Static and transient magnetic fields of a permanent magnet and a coil are available in the sample plane to reset the system and to provide external offset fields. The microscope generates a flat-top illumination field of 20 μm diameter by using a grating condenser [3] and the sample plane is directly imaged by a micro zone plate with 60 nm resolution onto a 2D gateable X-ray detector to select the particular bunch in the storage ring that contains the dynamic information. The setup is built into a mobile endstation vacuum system with in-house developed three-axis piezo motorized stages for high accuracy positioning of all microscopy- components inside the chambers.