Electron impact multiple ionization

28th International Conference on Photonic, Electronic and Atomic Collisions

Montanari, C.C.^1 ; Miraglia, J.E.^1

Instituto de Astronomía y Física Del Espacio, Buenos Aires, Argentina^1

关键词: Auger-type process;    Branching ratio;    Collisional ionization;    First Born approximation;    High impact energy;    Multiple ionization;    Theoretical calculations;    Theoretical modeling;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/488/4/042013/pdf
DOI  :  10.1088/1742-6596/488/4/042013

来源: IOP

【 摘 要 】

We present theoretical calculations of electron impact multiple ionization of rare gases (single to quintuple for Ne, Ar, Kr and Xe). The theoretical model used is the CDW-EIS, adapted for electron impact, and the first Born approximation for the high impact energies (E>0.6 keV). The results presented here take into account the direct and the post-collisional ionization. The latter by including experimental branching ratios of Auger type processes. This formalism describes the experimental data quite well. In the case of Kr and Xe we obtain good tendency even for sextuple ionization.