Secondary Electron Emission from Carbon Foils under O2+ Ion Impact

28th International Conference on Photonic, Electronic and Atomic Collisions

Yu, Y.^1,2 ; Liu, S.D.^1,2 ; Zhao, Y.T.^1 ; Wang, Y.Y.^1 ; Zhou, X.M.^1 ; Cheng, R.^1 ; Li, Y.F.^1,2 ; Lei, Y.^1 ; Sun, Y.B.^1 ; Peng, H.B.^1

Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, Gansu

730000, China^1

University of Chinese Academy of Sciences, Beijing

100049, China^2

关键词: Carbon foils;    Electron emission yields;    Electronic stopping power;    Forward-and-backward;    Ion impact;    Secondary electron emissions;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/488/13/132045/pdf
DOI  :  10.1088/1742-6596/488/13/132045

来源: IOP

【 摘 要 】

Secondary electron emission yields in forward and backward direction from carbon foils (thickness of 74 nm) induced by O2+ions of energies form 1.9 keV/u to 11.3 keV/u have been measured. We find that the forward and the backward electron emission yields increase with the projectile kinetic energy. Further studies showed that the forward and the backward electron emission yields are approximately proportional to the electronic stopping power at the exit and entrance surfaces, respectively.