Comparison of parameters describing stratified surface topography

14th International Conference on Metrology and Properties of Engineering Surfaces

Pawlus, P.^1 ; Reizer, R.^2 ; Lenart, A.^3

Rzeszow University of Technology, W. Pola 2, 35-959 Rzeszow, Poland^1

University of Rzeszow, Institute of Technology, ul. Rejtana 16A, 35-959 Rzeszow, Poland^2

Pratt and Whitney AeroPower Rzeszów, Hetmanska 120, 35-078 Rzeszow, Poland^3

关键词: Two-process surfaces;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/483/1/012021/pdf
DOI  :  10.1088/1742-6596/483/1/012021

来源: IOP

【 摘 要 】

There are a lot of methods of two-process surface topography description. Some parameters can be computed from material ratio graph. There are included in ISO standards. The methods described in ISO standards 13565-2 (Pk, Ppk, Pvk, Pmr1 and Pmr2) and 13565-3 (Pmq, Pvq and Pmq) are compared in this paper. Profiles with given values of Pmq, Pvq and Pmq parameters and wavelengths were modelled. For these profiles, material ratio curve and Pk, Ppk, Pvk, Pmr1 and Pmr2 parameters were calculated. As a result, dependencies among parameters from ISO 13565-3 and ISO 13565-2 standard were found.