Freeform surface measurement and characterisation using a toolmakers microscope

14th International Conference on Metrology and Properties of Engineering Surfaces

Wong, Francis Seung-Yin^1 ; Chauh, Kong-Bieng^1 ; Venuvinod, Patri K^1

City University of Hong Kong 1, Hong Kong, Hong Kong^1

关键词: CAD designs;    CNC milling;    Computer aided;    Feature recognition;    Free-form surface;    New approaches;    Surface data;    Uncertainty limits;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/483/1/012004/pdf
DOI  :  10.1088/1742-6596/483/1/012004

来源: IOP

【 摘 要 】

Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: Feature recognition and extraction from surface data Characterisation of properties of the surface's M and N vectors at individual vertex Development of a measuring plan using a toolmakers microscope for the inspection of the FFS Inspection of the actual FFS produced by CNC milling Verification of the measurement results and comparison with the CAD design data Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits.