Determination of 18 kinds of trace impurities in the vanadium battery grade vanadyl sulfate by ICP-OES

3rd International Conference on Energy Equipment Science and Engineering

Yong, Cheng^1

PanGang Group Research Institute Co., Ltd., State Key Laboratory of Vanadium and Titanium Resources Comprehensive Utilization, Panzhihua, Sichuan

617000, China^1

关键词: Background continuum;    Background correction;    Background-equivalent concentrations;    Direct determination;    Inductively coupled plasma atomic emission spectrometry;    Spectral interference;    Technical performance;    Vanadium batteries;   

Others  :  https://iopscience.iop.org/article/10.1088/1755-1315/128/1/012175/pdf
DOI  :  10.1088/1755-1315/128/1/012175

来源: IOP

【 摘 要 】

The method that direct determination of 18 kinds of trace impurities in the vanadium battery grade vanadyl sulfate by inductively coupled plasma atomic emission spectrometry (ICP-OES) was established, and the detection range includes 0.001% ∼ 0.100% of Fe, Cr, Ni, Cu, Mn, Mo, Pb, As, Co, P, Ti, Zn and 0.005% ∼ 0.100% of K, Na, Ca, Mg, Si, Al. That the influence of the matrix effects, spectral interferences and background continuum superposition in the high concentrations of vanadium ions and sulfate coexistence system had been studied, and then the following conclusions were obtained: the sulfate at this concentration had no effect on the determination, but the matrix effects or continuous background superposition which were generated by high concentration of vanadium ions had negative interference on the determination of potassium and sodium, and it produced a positive interference on the determination of the iron and other impurity elements, so that the impacts of high vanadium matrix were eliminated by the matrix matching and combining synchronous background correction measures. Through the spectral interference test, the paper classification summarized the spectral interferences of vanadium matrix and between the impurity elements, and the analytical lines, the background correction regions and working parameters of the spectrometer were all optimized. The technical performance index of the analysis method is that the background equivalent concentration -0.0003%(Na)∼0.0004%(Cu), the detection limit of the element is 0.0001%∼ 0.0003%, RSD