The temporal scale research of MODIS albedo product authenticity verification

8th IGRSM International Conference and Exhibition on Geospatial & Remote Sensing

地球科学;计算机科学

Cao, Yongxing^1 ; Xue, Zhihang^1 ; Cheng, Hui^2 ; Xiong, Yajv^2 ; Chen, Yunping^2 ; Tong, Ling^2

Electric Power Research Institute of Sichuan, Chengdu, China^1

University of Electronic Science and Technology of China, Chengdu, China^2

关键词: Authenticity verification;    Ground measurements;    Product certification;    Solar elevation;    Solar noon;    Statistical relations;    Surface albedo;    Temporal scale;   

Others  :  https://iopscience.iop.org/article/10.1088/1755-1315/37/1/012007/pdf
DOI  :  10.1088/1755-1315/37/1/012007

学科分类：计算机科学（综合）

来源: IOP

【 摘 要 】

This study introduces a method that normalizes the inversed ETM+ albedo to the local solar noon albedo for the temporal scale of the MODIS albedo validation. Firstly, the statistical relation model between the surface albedo and the solar elevation angle was set up, and then deducing relationship between ETM+ albedo and the solar elevation angle, so the ETM+ albedo at local solar noon could be got. Secondly, the ground measurement albedo at the local solar noon was used to assess the inversed ETM+ albedo and the normalized albedo. The experiment results show that the method can effectively improve the accuracy of product certification.