| 3rd International Conference on Aeronautical Materials and Aerospace Engineering | |
| In-orbit Failure Analysis and Verification for Thermistors outside Satellites | |
| 航空航天工程 | |
| Zhang, Bin^1^2 ; D., Wang ; Y., Fan ; L., Liu ; P., Zhao | |
| Beijing Institute of Spacecraft Environment Engineering, Beijing | |
| 100094, China^1 | |
| Assembly Processing Technology Center for Aerospace Product of CASC, Beijing | |
| 100094, China^2 | |
| Beijing Institute of Spacecraft System Engineering, Beijing | |
| 100094, China^3 | |
| 关键词: Analysis and verifications; Failure events; Fault-trees; In-orbit; Life-times; On board equipments; Thermal control; Thermal resistor; | |
| Others : https://iopscience.iop.org/article/10.1088/1757-899X/608/1/012036/pdf DOI : 10.1088/1757-899X/608/1/012036 |
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| 学科分类:航空航天科学 | |
| 来源: IOP | |
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【 摘 要 】
Satellite thermistor is used to measure the in-orbit temperature to support thermal control so that the on-board equipment can work in the appropriate temperature to get higer reliability and more life-time. In recent years, there have been several in-orbit failure events of thermistors outside the satellite, which have brought troubles to the thermal control of the whole satellite. In this paper, failure modes of in-orbit thermal resistors outside cabin are analyzed by fault tree, and ground simulation experiment is carried out by high-low temperature impact test. Fault cause is given according to test result and analysis.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| In-orbit Failure Analysis and Verification for Thermistors outside Satellites | 1134KB |
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