A Fault Isolation Method Based on S1000D Fault Data Module

2019 International Conference on Advanced Electronic Materials, Computers and Materials Engineering

无线电电子学;计算机科学;材料科学

Guo, Dexing^1 ; Du, Xiaoming^1

Shijiazhuang Campus of Army Engineering University, Shijiazhuang, China^1

关键词: Application level;    Fault data;    Fault diagnosis systems;    Fault isolation;    Information structures;    Integrated use;    Third parties;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/563/4/042002/pdf
DOI  :  10.1088/1757-899X/563/4/042002

来源: IOP

【 摘 要 】

Fault diagnosis isolation is one of the important function in IETM application. Aiming at the problems existing in the integrated use of third-party fault diagnosis system and IETM and the low application level of fault reporting information in IETM, the fault reporting information structure in S1000D is analysed in detail. A new method which integrates the fault reporting data within IETM platform is presented.