Intelligent systems for monitoring and controlling chip formation when cutting difficult-to-machine materials

International Conference on Mechanical Engineering, Automation and Control Systems 2018

Maksarov, V.V.^1 ; Makhov, V.E.^2

Saint-Petersburg Mining University, 21 Line, St. Petersburg

199106, Russia^1

Mozhaisky Military Space Academy, Zhdanov Street, 13, St. Petersburg

197082, Russia^2

关键词: Difficult to machine materials;    Geometric characteristics;    Industrial monitoring systems;    Material processing;    Monitoring and controlling;    Morphological analysis;    National Instruments;    Software platforms;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/560/1/012028/pdf
DOI  :  10.1088/1757-899X/560/1/012028

来源: IOP

【 摘 要 】

This research addresses topical issues of creating industrial monitoring systems for chips, which are formed when materials are cut, based on light field-based optical detectors. A proposed scheme uses a light field (LF) method to register formed chips with an optical detector. An algorithms and monitoring methods for key geometric parameters of chip shapes are developed based on the analysis of images obtained from LF cameras. They feature digital image capturing and morphological analysis. For practical implementation of developed algorithms, National Instruments software platform is used. This research shows that the result accuracy in determining geometric characteristics of chips using the proposed solutions makes it possible to run diagnostics for cutting and material processing equipment.